Next generation parallel inline ICT+FCT solution offers breakthrough performance Multi-Core Parallel testing with up to 4 independent cores for high throughput. SMEMA-compatible inline handler reduces operator workload and increases throughput, and durable Quick Disconnect Interface together with built-in auto-calibration and self-diagnostics ensure long-term testing reliability.

Main Features

 • New Generation Flexible Multi-Core Parallel Tester
 • State-of-the-Art Serial Test Controller with up to 8 ports on any pin
 • Limited access solution and functional test expansion using PXImodules
 • Built-in Self Diagnostics and Auto-Calibration function
 • High-Accuracy Measurement and Testing
 • SMEMA compatible inline high fault coverage test solution
 • Intuitive UI with flow-based easy program development

• Analog/Hybrid Test point expansion           
            TR5001Q SII INLINE     4096
            TR5001D SII INLINE     3328

• Operating system           Microsoft® Windows compatible PC with USB,                                            Windows 7-10

• Fixture type           Inline with long lifespan Quick Disconnection                                                 Interface

• Testable PCB size           (W) 70-450 mm x (L) 70-300 mm x (H) 0.6-5                                                 mm
 • Analogue Hardware           
           。6-wire measurement switching matrix
           。Programmable AC/DC/DC High voltage and current sources
           。AC/DC voltage, DC current measurement
           。Component R/L/C measurement
• Optional Components           
           。Analog Hardware            TestJet vectorless open circuit                                                                      detection, Arbitrary Waveform Generator                                                        (AWG)
          。Digital Testing           
                                                   ▪ Non-multiplexing 1:1 per pin architecture                                                    with independent per-pin level setting
                                                   ▪ DUTpowersupplies: 5V@3A, 3.3 V@3 A,                                                      12 V@3A, -12 V@1 A and 24V@3 A
                                                   ▪ Programmable DUT power supplies:                                                             75 V / 8 A max, 200W maximum output                                                         power
                                                  ▪ Includes BScan Chain Test, BScan Cluster                                                   Test, BScan Virtual Nails Test, BScan                                                             Virtual Chain Test and IEEE1149.6 Test
                                                 ▪ Up to 8 ports High Speed Serial, On-board                                                    Flash, EEPROM, MAC programming

         。Yield Management System integration (YMS 4.0)
• Dimensions           (W) 900 mm x (D)1080 mm x (H) 1670 mm

• Weight                  670 kg max


TR5001T SII TINY is a new generation of TRI's Tiny In-Circuit Tester. Offering up to 640 testing points and extending coverage with Boundary Scan, the TR5001T SII TINY brings an extended ICT feature set in the industry's most compact and affordable solution. The new generation desktop ICT offers parallel testing using multiple USB-connected units, Audio analyzer and Data acquisition modules and multiple programmable power supplies for testing devices and LED strips.

Main Features

 •  Compact and lightweight full-featured ICT solution
 •  USB interface for connecting up to four units to a notebook or PC
 •  Boundary Scan Solution with 2 independent TAPs and 16-channel DIO
 •  Advanced analogue and digital testing with programmable DUT power supplies

•  Windows 7 operating system 
•  High accuracy programmable DUT power supplies and DC/AC sources  •  Embedded digital signal processor 
•  Press or manual fixture support

•  Analog Testing
      。 640 analog test points, 6-wire measurement switching matrix
      。 Measures voltage, current and frequency
      。 Component R/L/C/D measurement
      。 60 V high voltage current source for LED strip testing
•  Digital Testing
      。 Frequency measurement up to 200 MHz
      。 16 bidirectional digital pins, 16 GPIO and 16 general purpose relays
•  Optional Hardware
      。 Boundary Scan
      。 Data Acquisition and Audio analyzer modules
      。 TestJet Technology
      。 Sine Wave Generator
      。 Enhanced Digital Test Module
      。 Inline testing solution

 • Dimensions:
                   (W) 334 mm x (D) 260 mm x (H) 182 mm 

•  Weight                         8-11 kg depending on selected configuration,                                               does not include PC or accessories.